Description
Features:
- Enables the R&S FPL1000 to perform fast and easy phase noise measurements in development and production
- With this FLP1-K40, the FPL1000 can measure single sideband phase noise across a selectable carrier offset frequency range displayed on a logarithmic axis
- Based on the measured phase noise, the user can determine the residual FM/φM and the jitter
Phase noise is an important parameter in wireless communications systems. The R&S FPL1-K40 option enables the R&S FPL1000 to perform fast and easy phase noise measurements in development and production.
Equipped with the R&S FPL1-K40 option, the R&S FPL1000 can measure single-sideband phase noise across a selectable carrier offset frequency range displayed on a logarithmic axis. Based on the measured phase noise, the user can determine the residual FM/φM and the jitter.
Phase noise measurement
- Carrier offset frequency range selectable from 1 Hz to 1 GHz in 1/3/10 sequence (1 Hz, 3 Hz, 10 Hz, 30 Hz, etc.)
- Number of averages, sweep mode and filter bandwidth can be individually selected for every measurement subrange to optimize the measurement speed
- Fast results for the subranges are obtained by starting the measurement at the maximum carrier offset
- Verification of carrier frequency and power prior to each measurement to prevent incorrect measurements
- Improvement of dynamic range by measuring the inherent thermal noise and performing noise correction
Measurement of residual FM/φM and jitter
- Integration across the entire selected carrier offset frequency range or across a selectable subrange
- Tabular display of residual FM, residual φM, and RMS jitter in addition to measurement trace
*The image is for reference only. See product specification for details.
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